EQP ½Ã½ºÅÛÀÇ Æ¯Â¡  |
Hiden EQP ½Ã½ºÅÛÀº ƯÁ¤ À̿ ¿¡³ÊÁö¿¡¼ÀÇ mass spectra¿Í
¼±ÅÃµÈ ÇöóÁ ÀÌ¿ÂÀÇ À̿ ¿¡³ÊÁö ºÐÆ÷¸¦ ¾òÀ» ¼ö ÀÖ´Â ³ôÀº Åõ°ú À̿¿¡³ÊÁö ºÐ¼®±â¿Í »çÁß ±ØÀÚ Áú·®ºÐ¼®±â°¡
°áÇÕµÈ ÇÑ ´Ü°è ¹ßÀüµÈ ÇöóÁ Áø´Ü µµ±¸ÀÌ´Ù. ¾Õ¼± ±â¼úÀÇ EQP ionizer´Â Áß¼º¹°Áú°ú ¶óµðÄ®À» °ËÃâ
°¡´ÉÄÉ Çϰí, À½ÀüÇÏÀÇ ÇöóÁ ÈÇкоß(electronegative plasma chemistries)¿¡¼
¶óµðÄ®¿¡ ´ëÇÑ °ËÃâ ´É·Â(detection capability)À» º¸´Ù Çâ»ó½ÃŲ ÀüÀÚ ºÎÂø ÀÌ¿ÂÈ ¹æ½Ä (electron
attachement ionization feature, electron attachment mass spectrometry)À»
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High
Sensitivity
À̿µé, Áß¼º¹°Áú°ú ¶óµðÄ®ÀÇ ppm ÀÌÇÏÀÇ ´ÜÀ§¿¡¼ °ËÃâ. |
Ion
Energy Analysis
ÇöóÁ À̿µ鿡 ´ëÇÑ À̿¿¡³ÊÁö ºÐÆ÷¸¦ ¼öÃʳ»¿¡ ¾òÀ» ¼ö ÀÖÀ¸¸ç, 100eV¿Í 1000eV ¿¡³ÊÁö ¹üÀ§ÀÇ
¸ðµ¨ÀÌ Á¦°øµÈ´Ù. |
Afterglow,
Pulsed Plasma, and Laser Ablation
Ç¥ÁØ TTL signal gating inputÀº time resolved ¿¬±¸¿¡ Æ÷ÇԵȴÙ. 1 ¸¶ÀÌÅ©·ÎÃʸ¸Å
ªÀº ½Ã°£ µ¿¾È ÇöóÁ pulses¿Í ÇöóÁ plumes ºÐ¼®ÀÌ °¡´ÉÇÏ´Ù. |
Positive
and Negative Ion Measurement
¹Ì¸® ¼³Á¤µÈ software Mode¿¡ ÀÇÇØ ¾çÀÌ¿Â, À½À̿°ú Áß¼º¹°Áú ºÐ¼® Mode°£ÀÇ Áï°¢ÀûÀÎ switchingÀÌ
°¡´ÉÇÏ´Ù. |
Neutral
and Rdical Detection
EQP integral electron impact ionizer¿¡ ÀÇÇØ Áß¼º¹°Áú°ú ·¡µðÄÃÁ¾µéÀÇ ºÐ¼®ÀÌ °¡´ÉÇÏ´Ù. |
Appearance
Potential Spectra
EQP ÀÌ¿ÂÈ ÀåÄ¡´Â ¼±ÅÃµÈ Á¾µéÀÇ appearance potential spectra¿¡ ´ëÇØ ¸ðµç À̿ source
º¯¼öµé- ÀüÀÚ¿¡³ÊÁö(electron energy)¸¦ Á¤È®È÷ ÆÇµ¶ÇÒ ¼ö ÀÖ´Â ÀåÄ¡ Æ÷ÇÔ- ¿¡ ´ëÇÑ Á¤¹ÐÇÑ ÅëÁ¦·Î
Ư¡Áö¾îÁø´Ù. Appearance potential spectra¸¦ ÅëÇÏ¿© ÇöóÁ Áß¼º ¹°ÁúÁ¾µéÀÇ ¿©±â »óÅÂ(excitation
state)¿Í ±úÁü»óÅÂ(fragmentation state)¸¦ È®ÀÎÇÒ ¼ö ÀÖ´Â Á÷Á¢ÀûÀÎ Á¤º¸¸¦ ¾òÀ» ¼ö ÀÖ´Ù. |
Electron
Attachment Ionization Feature
Soft ÀÌ¿ÂÈÀÇ ½Å±â¼úÀº ÇöóÁ¿¡¼ À½ÀüÇÏ(electronegative) Á¾µéÀÇ ºÐ¼®À» À§ÇØ optionÀ¸·Î¼
Á¦°øµÇ¸ç Áß¼º¹°Áú°ú ·¡µðÄ®ÀÇ ºÐ¼®À» Á»´õ Çâ»ó ½ÃŲ´Ù. |