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The SMD3000 offers solutions for a wide range of analytical requirements. The optics permit switched Bragg-Brentano, focusing and parallel beam geometry using Accessories. Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.

- High Resolution X-Ray Diffraction and X-Ray Reflectometry
- High resolution due to asymmetrical, 4 bounce Ge(220) monochromator
- High and Low temperature attachments
- High mechanical stability of the goniometer supported by a marble table
- Motorized sample holder with Z, Phi and Chi movements
- Grazing Incident Diffraction(GID)
- Stress and texture measurements
- Five degrees of freedom, all motorised

• Routine Qualitative and Quantitative Analysis
• Phase Analysis
• Thin-Films Analysis
• Non-Ambient Analysis
• Crystallite Size / Lattice Strain
• Retained Austenite Quantification
• Residual Stress Analysis
• Structure solution and refinement
• High Resolutions XRD and X-Ray Reflectometry
• Texture and Preferred Orientation and Crystallinity Calculations
• Etc.